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Browsing by Author Choque Aquino, Jovanetty Iván
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Showing results 1 to 1 of 1
info:eu-repo/semantics/masterThesis
Determinación de la topografía superficial de películas delgadas de TiO2 y SiC mediante interferometría tipo Michelson
Choque Aquino, Jovanetty Iván
Asesorado por
Asmad Vergara, Miguel Augusto
23-Nov-2016
Pontificia Universidad Católica del Perú
Interferometría
;
Películas delgadas